Atomic Force Microscope (AFM)
Model: Multimode 8 SPM (Bruker)
The Atomic Force Microscope (AFM) is a powerful instrument for nanometer scale science and technology.
Principle:-
The AFM principle is based on the cantilever/tip assembly that interacts with the sample; this assembly is also commonly referred to as the probe. The AFM probe interacts with the substrate through a raster scanning motion. The up/down and side to side motion of the AFM tip as it scans along the surface is monitored through a laser beam reflected off the cantilever. This reflected laser beam is tracked by a position sensitive photo-detector (PSPD) that picks up the vertical and lateral motion of the probe. The deflection sensitivity of these detectors has to be calibrated in terms of how many nanometres of motion correspond to a unit of voltage measured on the detector.
Usage:
1 Materials Science: Obtain 3-D images of surfaces with atomic resolution revealing features like defects, grain boundaries etc.
2 Nanotechnology: Characterizing size, shape and surface morphology of nanomaterials
3 Semiconductors:Providing high-resolution potential profiles of semiconductor devices