NANO-INDENTER Available for Booking
  • 1. 2D High Resolution Indenter Head Assembly

     Normal Displacement

    • Displacement resolution <0.006nm
    • Displacement noise floor <0.2nm
    • Total indenter travel in vertical direction ~50mm
    • Maximum indentation depth >5μm
    • Thermal drift 0.05nm/s

     Normal Load

    • Maximum load 10mN
    • Load resolution <1 nN
    • Minimum contact force <70nN
    • Load noise floor ≤30nN
    • Maximum Load rate >50mN/s

     Lateral Displacement

    • Displacement resolution <0.02nm
    • Displacement noise floor <2nm
    • Maximum Displacement 15μm
    • Minimum lateral displacement 500nm
    • Thermal drift 0.05nm/s

    Lateral Load

    • Maximum Load 2mN
    • Load resolution <50nN
    • Load noise floor <3.5μN

     In-situ SPM Imaging

    • Minimum imaging force <70nN
    • Scan rate 0.01Hz-3.0Hz
    • Scan resolution 256x256 lines per image
    • Maximum scan volume 60x60x4μm
    • Tip positioning accuracy +/- 10nm
    • Automated imaging and indenting capability
    • Piezo automation to allow point-and – click test location selection and setup of arrays for automated indentation patterns

     Scanning Wear

    • Wear track size Adjustable from <1μm to 60μm
    • Scan velocity ≤ 180μm/s
    • Normal load range 70nN - 1mN

    2. Multi-Range Nanoprobe (High Load)

    • Maximum Lateral Force: 5N
    • Lateral Force Noise Floor: 40μN
    • Maximum Scratch Length: Limited by circular sample stage (~25mm)
    • Lateral Displacement Noise Floor: 100nm
    • Maximum Normal Force: 2N
    • Normal Force Noise Floor: 0.5nm
    • Maximum Normal Displacement: 80μm
    • Normal Displacement Noise Floor: 0.5nm

    3. NanoDMA

    • Frequency Range: 0.1Hz-300Hz
    • Maximum Dynamic Force Amplitude: 5mN
    • Maximum Quasi-Static Force: 10mN
    • Force Noise Floor: <30nN
    • Maximum Dynamic Displacement Amplitude: 2.5μm
    • Maximum Quasi-Static Displacement: 5μm
    • Displacement Noise Floor: <0.2nm

     

    4. X, Y ,Z translation stage (coarse positioning)

    • X-Y Travel 250mmx150mm
    • Measured accuracy <1μm
    • Measured positioning repeatability <1μm
    • Micro step resolution X, Y axis 50nm
    • Micro step resolution Z axis 3nm
    • X-Y encoder resolution 100nm
    • Maximum translation speed X, Y axis 30mm/s
    • Maximum translation speed Z axis 1.9mm/s

    5. Data Acquisition specifications

    • Data acquisition rate (open and closed loop): up to 38,000 points/second
    • Load time 0.1 – 2000 seconds.
    • Maximum number of loading segments 2,000
    • Feedback loop rate in closed loop operation: 78kHz

    6. Electrical Contact Resistance (nanoECR)

    • Current measurement noise floor: 20 pA
    • Current measurement resolution: 5pA
    • Voltage measurement noise floor: 10 μV
    • Voltage measurement resolution: 5μV
    • Maximum Current (software limited): 10mA
    • Maximum Voltage (software limited): 10V
    • Electrical measurement rate: Up to 4kHz
    • Maximum load: 10 mN
    • Load Resolution: <1nN
    • Load noise floor: ≤30nN
    • Displacement Resolution: 0.02nm
    • Displacement noise floor: 0.2nm
    • Shielded System Enclosure
    • Auxillary Data Channel Acquisition

     

    7. Optical Microscope specification

    • Optical resolution 1μm
    • Digital zoom 0.5X – 11X
    • Optical Objective 20X
    • Apparent magnification (monitor view) 220X-2200X
    • Maximum field of view 772x588μm
    • Minimum field of view 30x24μm

     

    8.  Active Vibration Isolation

    • Frequency range 1.0 – 200Hz active damping, >200Hz passive damping
    • Transmissibility <0.017 above 10Hz and decreasing rapidly beyond 100Hz
    • System noise <50ng per root Hz from 0.1 - 300Hz
    • Static Compliance 14.0μm/N vertical, 28μm/N horizontal
    • Correction Forces 16N vertical, 8N horizontal

    9.  Acoustic and thermal isolation enclosure

    • Multi-layered acoustic dampening Environmental acoustic noise should not be more than 75 dB.
    • Larger front door for improved sample access
    • Larger side windows for improved operator visibility
    • Sealed enclosure for atmospheric conditioning

     

     

  • Charges & Payment Details for Nanoindenter (per slot of 3 hours)

    Experiments

    Internal

    External Academic Users

    (Rs) with GST 18% extra

    Industry Users

    (Rs) with GST 18% extra

    Phd/Project Student (Rs)

    Consultancy work (Rs)

    Nanoindenter

    500

    700

    1000

    2500

    ** For External Users

    • Additionally, 18% GST is applicable for TBIF and External Users as per GOI norms
    • Payment can be made through any mode to this account number such as NEFT/RTGS/UPI payment gateways/QR scanner

     

     Bank Details for transfer of sample Analysis charges

    Name of Institute

    Indian Institute of Technology

    Name of the Institute

    Account holder/Designation

    Registrar, IIT Ropar

    Bank Account Name

    IIT Ropar Revenue Account

    Type of bank

    Account

    Saving Account

    Complete Account

    Number

    37360100716

    RTGS/IFSC code of

    the Branch

    SBIN0013181

    MICR Code

    140002008

    Name of Bank

    State Bank of India

    UPI ID

    theregistrar716@sbi

                                                                                                                         

    • Checklist to be submitted:
      • Completely filled and signed Job Requisition Form
      • Duly prepared Samples (or mention if preparation is reqd.)
      • Self-addressed envelope with appropriate postal stamps (if invoice is reqd. by post)
      • Proof of payment with transaction details
  • Image Gallery
  • Faculty In-charge

    Dr. Hariprasad Gopalan, Asst. Prof.

    Email: hariprasad.gopalan@iitrpr.ac.in

    Ph.: 01881-23-2414

    Operator

    Mr Harsimranjit Singh, Technical Supritendent

    Email: nanoindenter@iitrpr.ac.in

    Ph.: 01881-23-2566