IIT

FEI THEMIS 300 KV HR-TEM WITH PROBE ABERRATION CHARACTER Available for Booking

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Transmission Electron Microscope (HR-TEM)

Model- Themis 300 kV

Usage:

1 Materials Science: Atomic-level imaging and analysis of metals, ceramics, and semiconductors

2 Nanotechnology: Characterization of nanostructures like nanoparticles and quantum dots

3 Life Sciences: Imaging biomolecules and viruses in high resolution.

SPECIFICATIONS

Accelerating voltage: 60 -300 kV

Electron source: High brightness Schottky field emission electron source (X-FEG)

Integrated electron source energy monochromator for beam energy widths to <150meV

Probe forming optics include an advanced 4th order (5th order optimized) spherical aberration corrector (DCOR)

Probe corrector tunings at 60, 80, and 300 kV

STEM resolution: ranging from <60pm at 300kV to <120pm at 60 kV

Greater than 100 pA probe currents available in a 1 angstrom electron probe

High Angle Annular Dark Field (HAADF) detector and on-axis bright field/dark field STEM detector

Integrated Differential Phase Contrast (iDPC) for light element (low Z) imaging

Simultaneous collection of BF/ABF/DF and HAADF images on the system

TEM mode: information transfer of 60pm at 300kV to 100pm at 60kV

4-crystal EDS (Energy Dispersive Spectroscopy for X-Rays) detection system (FEI Super-X)

Large EDS collection solid angle of 0.7 steradians for atomic scale EDS analysis

EDS compatible with large sample rotation/tilt for 3D EDS tomography

Constant power magnetic lenses enabling faster mode and accelerating voltage changes switching by eliminating related thermal drift and providing high controllability and reproducibility

Automated tuning for the monochromator and corrector (OptiMono & OptiSTEM+)

Computerized 5-axes Piezo enhanced stage

High-speed, digital search-and-view camera

FEI Ceta 16M 16-megapixel digital camera for for imaging and diffraction applications

STEM & TEM tomography acquisition software and high field-of-view single-tilt tomography holder

Precession electron diffraction

Applications

FEI Themis 300 kV will meet the research needs of electron imaging and chemical analysis in materials research. Specifically, the microscope enables imaging and chemical mapping in 2D and 3D at atomic or nanoscales by providing following research capabilities: 1) performing low voltage spectral analysis for molecules and single atoms, 2) analysis of composition and crystallographic orientation in 2D and 3D using EDS.

Charges & Payment Details for HR-TEM (Per Slot-each slot is of 3 hours)

Instrument	Experiments	Internal Users		External Academic Users (Rs)+18% GST EXTRA	Industry Users (Rs)+18% GST Extra
Instrument	Experiments	Phd/Project Student (Rs)	Consultancy work (Rs)	External Academic Users (Rs)+18% GST EXTRA	Industry Users (Rs)+18% GST Extra
TEM-120 kV	Imaging, SAD, EDX, Elemental mapping	3000	4000	4000	6000
TEM GRID CHARGES(if required) per grid		700	1000	1000	1500
Sample Preparation Charges (per sample)		100	150	200	500

** For External Users

Additionally, 18% GST is applicable for TBIF and External Users as per GOI norms

Payment can be made through any mode to this account number such as NEFT/RTGS/UPI payment gateways/QR scanner

Bank Details for transfer of sample Analysis charges

Name of Institute	Indian Institute of Technology
Name of the Institute Account holder/Designation	Registrar, IIT Ropar
Bank Account Name	IIT Ropar Revenue Account
Type of bank Account	Saving Account
Complete Account Number	37360100716
RTGS/IFSC code of the Branch	SBIN0013181
MICR Code	140002008
Name of Bank	State Bank of India
UPI ID	theregistrar716@sbi

Checklist to be submitted:
Completely filled and signed Job Requisition Form
Duly prepared Samples (or mention if preparation is reqd.)
Self-addressed envelope with appropriate postal stamps (if invoice is reqd. by post)
Proof of payment with transaction details